TY  - JOUR 
AU  - Dziarski, Krzysztof 
AU  - Hulewicz, Arkadiusz 
TI  - Verification of the die Temperature of a SiC Transistor Based on the Thermal Imaging and Machine Learning 
JO  - Pomiary Automatyka Robotyka 
PY  - 2025 
KW  - artificial neural network 
KW  - convolutional neural network 
KW  - thermography 
DO  - 10.14313/PAR_257/119 
VL  - 29  
IS  - 257 
SP  - 119 
EP  - 127 
UR  - https://www.par.pl/Archiwum/2025/3-2025/Verification-of-the-die-Temperature-of-a-SiC-Transistor-Based-on-the-Thermal-Imaging-and-Machine-Learning 
M3  - http://dx.doi.org/10.14313/PAR_257/119 
ER  -